Scratch Assay (SCR)

The SCR package is developed for the analysis of the 'scratch' area on bright field images of confluent cell cultures, in which a scratch has been made. Either vertically or horizontally aligned scratches can be found.

Warnings can be issued for scratch misalignment (e.g. due to stage mispositioning, cell death, ...) and for empty areas.




Analysis of time-lapse experiments is possible; two ‘area’ output features are reported:
- Total scratch area at each time point Tx
- Scratch area (at Tx) enclosed by the scratch boundaries at T0 (= initial condition)

The evolution in the scratch area vs. the T0-enclosed area can easily be monitored by scrolling through the different overlay images (e.g. for quality control purposes).

• Tuneable algorithm parameters allow perfect detection of scratch areas on your samples
• A powerful visualisation module allows quick reviewing of images and output data
• The software is scanning station independent as it comes with image importers
• The DCILABS Help Library simply guides you through the program when needed